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Information card for entry 4346372
Preview
| Coordinates | 4346372.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H56 P4 Se8 U |
|---|---|
| Calculated formula | C24 H56 P4 Se8 U |
| SMILES | [U]1234([Se]=P([Se]3)(C(C)C)C(C)C)([Se]=P([Se]1)(C(C)C)C(C)C)([Se]=P([Se]2)(C(C)C)C(C)C)[Se]=P([Se]4)(C(C)C)C(C)C |
| Title of publication | Dithio- and Diselenophosphinate Thorium(IV) and Uranium(IV) Complexes: Molecular and Electronic Structures, Spectroscopy, and Transmetalation Reactivity. |
| Authors of publication | Behrle, Andrew C.; Kerridge, Andrew; Walensky, Justin R. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 24 |
| Pages of publication | 11625 - 11636 |
| a | 16.7142 ± 0.001 Å |
| b | 13.2787 ± 0.0008 Å |
| c | 18.4521 ± 0.0011 Å |
| α | 90° |
| β | 96.405 ± 0.001° |
| γ | 90° |
| Cell volume | 4069.7 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0169 |
| Residual factor for significantly intense reflections | 0.016 |
| Weighted residual factors for significantly intense reflections | 0.034 |
| Weighted residual factors for all reflections included in the refinement | 0.0342 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4346372.html
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