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Information card for entry 4346962
Preview
| Coordinates | 4346962.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H210 Cu9 N5 Na12 O116.5 P10 Si W9 |
|---|---|
| Calculated formula | C20 H45 Cu9 N5 Na11.5 O116.5 P10 Si W9 |
| Title of publication | Heteroanionic Materials Based on Copper Clusters, Bisphosphonates, and Polyoxometalates: Magnetic Properties and Comparative Electrocatalytic NO(x) Reduction Studies. |
| Authors of publication | Oms, Olivier; Yang, Shu; Salomon, William; Marrot, Jérôme; Dolbecq, Anne; Rivière, Eric; Bonnefont, Antoine; Ruhlmann, Laurent; Mialane, Pierre |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 4 |
| Pages of publication | 1551 - 1561 |
| a | 23.356 ± 0.0008 Å |
| b | 22.4995 ± 0.0008 Å |
| c | 28.2725 ± 0.0009 Å |
| α | 90° |
| β | 99.633 ± 0.0017° |
| γ | 90° |
| Cell volume | 14647.7 ± 0.9 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 9 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1398 |
| Residual factor for significantly intense reflections | 0.0827 |
| Weighted residual factors for significantly intense reflections | 0.189 |
| Weighted residual factors for all reflections included in the refinement | 0.2191 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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