Information card for entry 4349384

Structure parameters

• Formula: C32 H70 Al2 Co N2 Si4
• Calculated formula: C32 H70 Al2 Co N2 Si4
• SMILES: C[Si](C)(C)N([Al]123([c]4([c]1(c(c(c4C)C)C)C)C)[H][Co]143([H]2)[H][Al]24([c]3([c]2(c(c(c3C)C)C)C)C)([H]1)N([Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C
• Title of publication: Diverse Reactivity of ECp* (E = Al, Ga) toward Low-Coordinate Transition Metal Amides [TM(N(SiMe₃)₂)₂] (TM = Fe, Co, Zn): Insertion, Cp* Transfer, and Orthometalation.
• Authors of publication: Weßing, Jana; Göbel, Christoph; Weber, Birgit; Gemel, Christian; Fischer, Roland A.
• Journal of publication: Inorganic chemistry
• Year of publication: 2017
• Journal volume: 56
• Journal issue: 6
• Pages of publication: 3517 - 3525
• a: 8.6323 ± 0.0003 Å
• b: 9.6301 ± 0.0003 Å
• c: 13.9237 ± 0.0005 Å
• α: 94.067 ± 0.002°
• β: 106.104 ± 0.001°
• γ: 113.135 ± 0.001°
• Cell volume: 1001.2 ± 0.06 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0517
• Residual factor for significantly intense reflections: 0.0344
• Weighted residual factors for significantly intense reflections: 0.0722
• Weighted residual factors for all reflections included in the refinement: 0.0776
• Goodness-of-fit parameter for all reflections included in the refinement: 1.035
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No