Information card for entry 4349383

Structure parameters

• Formula: C32 H66 Al2 N2 Si4 Zn
• Calculated formula: C32 H66 Al2 N2 Si4 Zn
• SMILES: c1(c([c]2([Al]([Zn][Al]3([c]4(c(c(c([c]34C)C)C)C)C)N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[c]2(c1C)C)C)C)C
• Title of publication: Diverse Reactivity of ECp* (E = Al, Ga) toward Low-Coordinate Transition Metal Amides [TM(N(SiMe₃)₂)₂] (TM = Fe, Co, Zn): Insertion, Cp* Transfer, and Orthometalation.
• Authors of publication: Weßing, Jana; Göbel, Christoph; Weber, Birgit; Gemel, Christian; Fischer, Roland A.
• Journal of publication: Inorganic chemistry
• Year of publication: 2017
• Journal volume: 56
• Journal issue: 6
• Pages of publication: 3517 - 3525
• a: 8.5944 ± 0.0005 Å
• b: 9.6962 ± 0.0005 Å
• c: 14.0679 ± 0.0009 Å
• α: 93.962 ± 0.005°
• β: 106.393 ± 0.005°
• γ: 112.654 ± 0.005°
• Cell volume: 1016.75 ± 0.12 ų
• Cell temperature: 113 K
• Ambient diffraction temperature: 113 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0457
• Residual factor for significantly intense reflections: 0.0354
• Weighted residual factors for significantly intense reflections: 0.0898
• Weighted residual factors for all reflections included in the refinement: 0.097
• Goodness-of-fit parameter for all reflections included in the refinement: 1.044
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No