Information card for entry 4502784
| Common name |
1I, m-xylene |
| Chemical name |
1,3,5-triethyl-2,4,6-tris(4-iodophenoxy)methylbenzenes, m-xylene |
| Formula |
C41 H43 I3 O3 |
| Calculated formula |
C41 H43 I3 O3 |
| SMILES |
Ic1ccc(OCc2c(c(c(c(COc3ccc(I)cc3)c2CC)CC)COc2ccc(I)cc2)CC)cc1.c1(cc(C)ccc1)C |
| Title of publication |
Isostructurality in the Guest Free Forms and in the Clathrates of 1,3,5-Triethyl-2,4,6-tris(4-halophenoxy)methylbenzenes |
| Authors of publication |
Bhattacharya, Suman; Saha, Binoy K. |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2012 |
| Journal volume |
12 |
| Journal issue |
1 |
| Pages of publication |
169 |
| a |
10.0669 ± 0.0009 Å |
| b |
13.5062 ± 0.0013 Å |
| c |
15.7971 ± 0.0014 Å |
| α |
67.16 ± 0.009° |
| β |
83.771 ± 0.007° |
| γ |
89.449 ± 0.008° |
| Cell volume |
1966.5 ± 0.3 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.161 |
| Residual factor for significantly intense reflections |
0.0642 |
| Weighted residual factors for significantly intense reflections |
0.1333 |
| Weighted residual factors for all reflections included in the refinement |
0.1819 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.006 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4502784.html