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Information card for entry 4502785
Preview
| Coordinates | 4502785.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 1I, o-xylene |
|---|---|
| Chemical name | 1,3,5-triethyl-2,4,6-tris(4-iodophenoxy)methylbenzenes, o-xylene |
| Formula | C41 H43 I3 O3 |
| Calculated formula | C41 H43 I3 O3 |
| Title of publication | Isostructurality in the Guest Free Forms and in the Clathrates of 1,3,5-Triethyl-2,4,6-tris(4-halophenoxy)methylbenzenes |
| Authors of publication | Bhattacharya, Suman; Saha, Binoy K. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2012 |
| Journal volume | 12 |
| Journal issue | 1 |
| Pages of publication | 169 |
| a | 10.0282 ± 0.0009 Å |
| b | 13.4705 ± 0.0014 Å |
| c | 16.0032 ± 0.0017 Å |
| α | 67.312 ± 0.01° |
| β | 83.012 ± 0.008° |
| γ | 88.381 ± 0.008° |
| Cell volume | 1979.3 ± 0.4 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1004 |
| Residual factor for significantly intense reflections | 0.0661 |
| Weighted residual factors for significantly intense reflections | 0.1816 |
| Weighted residual factors for all reflections included in the refinement | 0.2123 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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