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Information card for entry 4512163
Preview
| Coordinates | 4512163.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C92 H128 N12 O34 P8 |
|---|---|
| Calculated formula | C92 H128 N12 O34 P8 |
| Title of publication | Extending the Family of Tetrahedral Tectons: Phenyl Embraces in Supramolecular Polymers of Tetraphenylmethane-based Tetraphosphonic Acid Templated by Organic Bases |
| Authors of publication | Zaręba, Jan K.; Białek, Michał J.; Janczak, Jan; Zoń, Jerzy; Dobosz, Agnieszka |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2014 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 6143 |
| a | 28.5639 ± 0.0015 Å |
| b | 14.5854 ± 0.0005 Å |
| c | 24.8546 ± 0.001 Å |
| α | 90° |
| β | 90.449 ± 0.006° |
| γ | 90° |
| Cell volume | 10354.5 ± 0.8 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1349 |
| Residual factor for significantly intense reflections | 0.0723 |
| Weighted residual factors for significantly intense reflections | 0.1337 |
| Weighted residual factors for all reflections included in the refinement | 0.165 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4512163.html
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