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Information card for entry 4512164
Preview
| Coordinates | 4512164.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C74 H130 N8 O33 P8 |
|---|---|
| Calculated formula | C74 H112 N8 O33 P8 |
| Title of publication | Extending the Family of Tetrahedral Tectons: Phenyl Embraces in Supramolecular Polymers of Tetraphenylmethane-based Tetraphosphonic Acid Templated by Organic Bases |
| Authors of publication | Zaręba, Jan K.; Białek, Michał J.; Janczak, Jan; Zoń, Jerzy; Dobosz, Agnieszka |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2014 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 6143 |
| a | 12.4393 ± 0.001 Å |
| b | 13.0786 ± 0.001 Å |
| c | 15.4598 ± 0.001 Å |
| α | 78.48 ± 0.006° |
| β | 69.405 ± 0.007° |
| γ | 89.5 ± 0.006° |
| Cell volume | 2301.8 ± 0.3 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1897 |
| Residual factor for significantly intense reflections | 0.086 |
| Weighted residual factors for significantly intense reflections | 0.1016 |
| Weighted residual factors for all reflections included in the refinement | 0.1469 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4512164.html
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