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Information card for entry 4516815
Preview
| Coordinates | 4516815.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C11 H6 Br N |
|---|---|
| Calculated formula | C11 H6 Br N |
| Title of publication | Thiolate versus Selenolate: Structure, Stability, and Charge Transfer Properties. |
| Authors of publication | Ossowski, Jakub; Wächter, Tobias; Silies, Laura; Kind, Martin; Noworolska, Agnieszka; Blobner, Florian; Gnatek, Dominika; Rysz, Jakub; Bolte, Michael; Feulner, Peter; Terfort, Andreas; Cyganik, Piotr; Zharnikov, Michael |
| Journal of publication | ACS nano |
| Year of publication | 2015 |
| Journal volume | 9 |
| Journal issue | 4 |
| Pages of publication | 4508 - 4526 |
| a | 4.7861 ± 0.0007 Å |
| b | 5.9851 ± 0.0009 Å |
| c | 7.9546 ± 0.0011 Å |
| α | 83.224 ± 0.012° |
| β | 75.23 ± 0.011° |
| γ | 84.63 ± 0.012° |
| Cell volume | 218.31 ± 0.06 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1279 |
| Residual factor for significantly intense reflections | 0.1273 |
| Weighted residual factors for significantly intense reflections | 0.3192 |
| Weighted residual factors for all reflections included in the refinement | 0.3193 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.411 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4516815.html
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