Information card for entry 4516816
| Formula |
C11 H8 Br N O |
| Calculated formula |
C11 H8 Br N O |
| SMILES |
Brc1cc2c(cc1)cc(cc2)C(=O)N |
| Title of publication |
Thiolate versus Selenolate: Structure, Stability, and Charge Transfer Properties. |
| Authors of publication |
Ossowski, Jakub; Wächter, Tobias; Silies, Laura; Kind, Martin; Noworolska, Agnieszka; Blobner, Florian; Gnatek, Dominika; Rysz, Jakub; Bolte, Michael; Feulner, Peter; Terfort, Andreas; Cyganik, Piotr; Zharnikov, Michael |
| Journal of publication |
ACS nano |
| Year of publication |
2015 |
| Journal volume |
9 |
| Journal issue |
4 |
| Pages of publication |
4508 - 4526 |
| a |
18.518 ± 0.0016 Å |
| b |
6.151 ± 0.0003 Å |
| c |
8.6436 ± 0.0008 Å |
| α |
90° |
| β |
90.291 ± 0.007° |
| γ |
90° |
| Cell volume |
984.53 ± 0.13 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0496 |
| Residual factor for significantly intense reflections |
0.0476 |
| Weighted residual factors for significantly intense reflections |
0.1221 |
| Weighted residual factors for all reflections included in the refinement |
0.1253 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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