Information card for entry 4517785
| Formula |
C10 H10 N2 S |
| Calculated formula |
C10 H10 N2 S |
| SMILES |
s1c(ccc1)C/N=C/c1[nH]ccc1 |
| Title of publication |
New Palladium(II) and Platinum(II) Complexes Based on Pyrrole Schiff Bases: Synthesis, Characterization, X-ray Structure, and Anticancer Activity |
| Authors of publication |
Mbugua, Simon N.; Sibuyi, Nicole R. S.; Njenga, Lydia W.; Odhiambo, Ruth A.; Wandiga, Shem O.; Meyer, Mervin; Lalancette, Roger A.; Onani, Martin O. |
| Journal of publication |
ACS Omega |
| Year of publication |
2020 |
| Journal volume |
5 |
| Journal issue |
25 |
| Pages of publication |
14942 - 14954 |
| a |
9.6273 ± 0.0004 Å |
| b |
9.7032 ± 0.0004 Å |
| c |
20.4587 ± 0.0009 Å |
| α |
90° |
| β |
96.053 ± 0.002° |
| γ |
90° |
| Cell volume |
1900.51 ± 0.14 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0596 |
| Residual factor for significantly intense reflections |
0.0576 |
| Weighted residual factors for significantly intense reflections |
0.1632 |
| Weighted residual factors for all reflections included in the refinement |
0.1648 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.075 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4517785.html