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Information card for entry 4517786
Preview
| Coordinates | 4517786.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H18 Cl2 N2 O Pt S |
|---|---|
| Calculated formula | C14 H18 Cl2 N2 O Pt S |
| SMILES | [Pt]([S](=O)(C)C)(Cl)(Cl)[N](=Cc1[nH]ccc1)Cc1ccccc1 |
| Title of publication | New Palladium(II) and Platinum(II) Complexes Based on Pyrrole Schiff Bases: Synthesis, Characterization, X-ray Structure, and Anticancer Activity |
| Authors of publication | Mbugua, Simon N.; Sibuyi, Nicole R. S.; Njenga, Lydia W.; Odhiambo, Ruth A.; Wandiga, Shem O.; Meyer, Mervin; Lalancette, Roger A.; Onani, Martin O. |
| Journal of publication | ACS Omega |
| Year of publication | 2020 |
| Journal volume | 5 |
| Journal issue | 25 |
| Pages of publication | 14942 - 14954 |
| a | 8.0734 ± 0.0001 Å |
| b | 18.0661 ± 0.0003 Å |
| c | 11.5367 ± 0.0002 Å |
| α | 90° |
| β | 94.229 ± 0.001° |
| γ | 90° |
| Cell volume | 1678.1 ± 0.05 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0222 |
| Residual factor for significantly intense reflections | 0.0215 |
| Weighted residual factors for significantly intense reflections | 0.0494 |
| Weighted residual factors for all reflections included in the refinement | 0.0497 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.212 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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