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Information card for entry 7001480
Preview
| Coordinates | 7001480.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H48 N2 Ni P2 Si2 |
|---|---|
| Calculated formula | C44 H48 N2 Ni P2 Si2 |
| SMILES | [Ni]12([P](c3ccccc3)(c3ccccc3)CC[P]1(c1ccccc1)c1ccccc1)N([Si](C)(C)C)C12C(=N[Si](C)(C)C)c2c3c1cccc3ccc2 |
| Title of publication | 1,2-Bis(imino)acenaphthene complexes of molybdenum and nickel |
| Authors of publication | Fedushkin, Igor L.; Skatova, Alexandra A.; Lukoyanov, Anton N.; Khvoinova, Nalalie M.; Piskunov, Alexander V.; Nikipelov, Alexander S.; Fukin, Georgy K.; Lysenko, Konstantin A.; Irran, Elisabeth; Schumann, Herbert |
| Journal of publication | Dalton Transactions |
| Year of publication | 2009 |
| Journal issue | 24 |
| Pages of publication | 4689 - 4694 |
| a | 17.7917 ± 0.0005 Å |
| b | 14.5028 ± 0.0004 Å |
| c | 17.577 ± 0.0005 Å |
| α | 90° |
| β | 118.579 ± 0.001° |
| γ | 90° |
| Cell volume | 3982.8 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0684 |
| Residual factor for significantly intense reflections | 0.045 |
| Weighted residual factors for significantly intense reflections | 0.0956 |
| Weighted residual factors for all reflections included in the refinement | 0.1031 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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