Information card for entry 7006331

Structure parameters

• Common name: ((Na(tBuCN)(Me3SiNSiMe2Ph))2)
• Formula: C32 H58 N4 Na2 Si4
• Calculated formula: C32 H58 N4 Na2 Si4
• SMILES: [Na]1([N]#CC(C)(C)C)[N]([Si](C)(C)C)([Si](C)(C)c2ccccc2)[Na]([N]#CC(C)(C)C)[N]1([Si](C)(C)C)[Si](C)(C)c1ccccc1
• Title of publication: Reactions between a sodium amide Na[N(SiMe3)R1] (R1 = SiMe3, SiMe2Ph or But) and a cyanoalkane RCN (R = Ad or Bu(t)).
• Authors of publication: Avent, Anthony G.; Antolini, Floria; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 7
• Pages of publication: 919 - 927
• a: 10.9961 ± 0.0003 Å
• b: 10.9755 ± 0.0002 Å
• c: 17.7283 ± 0.0005 Å
• α: 90°
• β: 105.666 ± 0.001°
• γ: 90°
• Cell volume: 2060.11 ± 0.09 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0521
• Residual factor for significantly intense reflections: 0.0395
• Weighted residual factors for significantly intense reflections: 0.1011
• Weighted residual factors for all reflections included in the refinement: 0.1095
• Goodness-of-fit parameter for all reflections included in the refinement: 1.028
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No