Information card for entry 7006641

Structure parameters

• Formula: C42 H78 N2 Pd Si6
• Calculated formula: C42 H78 N2 Pd Si6
• SMILES: [Pd]1([Si]([Si]1([Si](C(C)(C)C)(C)C)[Si](C(C)(C)C)(C)C)([Si](C(C)(C)C)(C)C)[Si](C(C)(C)C)(C)C)(C#[N]c1c(cccc1C)C)C#[N]c1c(cccc1C)C
• Title of publication: Ligand dependence of pi-complex character in disilene-palladium complexes.
• Authors of publication: Iwamoto, Takeaki; Sekiguchi, Yumiko; Yoshida, Naoki; Kabuto, Chizuko; Kira, Mitsuo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 1
• Pages of publication: 177 - 182
• a: 12.988 ± 0.004 Å
• b: 13.561 ± 0.004 Å
• c: 16.667 ± 0.005 Å
• α: 97.695 ± 0.002°
• β: 104.615 ± 0.002°
• γ: 114.174 ± 0.003°
• Cell volume: 2496.2 ± 1.3 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0686
• Residual factor for significantly intense reflections: 0.0538
• Weighted residual factors for significantly intense reflections: 0.1019
• Weighted residual factors for all reflections included in the refinement: 0.1112
• Goodness-of-fit parameter for all reflections included in the refinement: 1.138
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No