Information card for entry 7006642

Structure parameters

• Formula: C40 H82 P2 Pd Si6
• Calculated formula: C40 H82 P2 Pd Si6
• SMILES: [Pd]1([P](C)(C)c2ccccc2)([P](C)(C)c2ccccc2)[Si]([Si]1([Si](C)(C)C(C)(C)C)[Si](C)(C)C(C)(C)C)([Si](C)(C)C(C)(C)C)[Si](C)(C)C(C)(C)C
• Title of publication: Ligand dependence of pi-complex character in disilene-palladium complexes.
• Authors of publication: Iwamoto, Takeaki; Sekiguchi, Yumiko; Yoshida, Naoki; Kabuto, Chizuko; Kira, Mitsuo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 1
• Pages of publication: 177 - 182
• a: 11.326 ± 0.003 Å
• b: 11.988 ± 0.003 Å
• c: 19.426 ± 0.005 Å
• α: 93.507 ± 0.003°
• β: 94.393 ± 0.003°
• γ: 100.588 ± 0.004°
• Cell volume: 2577.4 ± 1.2 ų
• Cell temperature: 173.15 K
• Ambient diffraction temperature: 173.15 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0671
• Residual factor for significantly intense reflections: 0.0503
• Weighted residual factors for significantly intense reflections: 0.081
• Weighted residual factors for all reflections included in the refinement: 0.0882
• Goodness-of-fit parameter for all reflections included in the refinement: 1.097
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No