Information card for entry 7008800

Structure parameters

• Formula: C28 H76 Li2 O8 Si8 Tl2
• Calculated formula: C28 H76 Li2 O8 Si8 Tl2
• SMILES: [Tl]1[C@@H]([Si]2([O]3([Li]45([O]([Si]([O]4C)([C@@H]1[Si](C)(C)C)C)C)[O]1([Li]43([O]2C)[O]([Si]([O]4C)([C@H]([Tl][C@H]([Si]1([O]5C)C)[Si](C)(C)C)[Si](C)(C)C)C)C)C)C)C)[Si](C)(C)C
• Title of publication: The coordination chemistry of the C1-symmetric bis(silyl)methyl ligand [CH(SiMe3){SiMe(OMe)2}]- revisited: Li/M- (M = Zn, Tl, Ce), Li4- or Ce2-methoxy-bridged alkyls.
• Authors of publication: Hitchcock, Peter B.; Huang, Qigu; Lappert, Michael F.; Zhou, Meisu
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2005
• Journal issue: 18
• Pages of publication: 2988 - 2993
• a: 13.2498 ± 0.0005 Å
• b: 9.4096 ± 0.0004 Å
• c: 20.7365 ± 0.0007 Å
• α: 90°
• β: 93.816 ± 0.002°
• γ: 90°
• Cell volume: 2579.6 ± 0.17 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0803
• Residual factor for significantly intense reflections: 0.0473
• Weighted residual factors for significantly intense reflections: 0.0855
• Weighted residual factors for all reflections included in the refinement: 0.0956
• Goodness-of-fit parameter for all reflections included in the refinement: 1.065
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No