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Information card for entry 7011772
Preview
| Coordinates | 7011772.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [YI(thf)2(C6H3iPr2NCH2CH2CH2NC6H3iPr2)] |
|---|---|
| Formula | C35 H56 I N2 O2 Y |
| Calculated formula | C35 H56 I N2 O2 Y |
| SMILES | [Y]1(I)([O]2CCCC2)([O]2CCCC2)N(CCCN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Yttrium iodide and bis(trimethylsilyl)methyl complexes of the chelating diamide [ArN(CH2)3NAr]2− (Ar = 2,6-iPr2C6H3) |
| Authors of publication | Cloke, F. Geoffrey N.; Elvidge, Benjamin R.; Hitchcock, Peter B.; Lamarche, Vanessa M. E. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2002 |
| Journal issue | 12 |
| Pages of publication | 2413 |
| a | 9.031 ± 0.005 Å |
| b | 21.883 ± 0.007 Å |
| c | 18.653 ± 0.007 Å |
| α | 90° |
| β | 98.93 ± 0.04° |
| γ | 90° |
| Cell volume | 3642 ± 3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0875 |
| Residual factor for significantly intense reflections | 0.048 |
| Weighted residual factors for significantly intense reflections | 0.087 |
| Weighted residual factors for all reflections included in the refinement | 0.0992 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7011772.html
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Users of the data should acknowledge the original authors of the
structural data.