Information card for entry 7011773

Structure parameters

• Common name: [Y(thf){CH(SiMe3)2}{(C6H3iPr2)N(CH2)3N(C6H3iPr2)}]
• Formula: C38 H67 N2 O Si2 Y
• Calculated formula: C38 H67 N2 O Si2 Y
• Title of publication: Yttrium iodide and bis(trimethylsilyl)methyl complexes of the chelating diamide [ArN(CH2)3NAr]2− (Ar = 2,6-iPr2C6H3)
• Authors of publication: Cloke, F. Geoffrey N.; Elvidge, Benjamin R.; Hitchcock, Peter B.; Lamarche, Vanessa M. E.
• Journal of publication: Journal of the Chemical Society, Dalton Transactions
• Year of publication: 2002
• Journal issue: 12
• Pages of publication: 2413
• a: 19.2377 ± 0.0004 Å
• b: 11.8507 ± 0.0002 Å
• c: 17.8432 ± 0.0003 Å
• α: 90°
• β: 90.028 ± 0.001°
• γ: 90°
• Cell volume: 4067.9 ± 0.13 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0655
• Residual factor for significantly intense reflections: 0.0457
• Weighted residual factors for significantly intense reflections: 0.0904
• Weighted residual factors for all reflections included in the refinement: 0.0984
• Goodness-of-fit parameter for all reflections included in the refinement: 1.055
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No