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Information card for entry 7022582
Preview
| Coordinates | 7022582.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C41 H61 Cr N2 O |
|---|---|
| Calculated formula | C41 H61 Cr N2 O |
| SMILES | [Cr]12([N](c3c(cccc3C(C)C)C(C)C)=C(C)C=C(N1c1c(cccc1C(C)C)C(C)C)C)([O]1CCCC1)C(=C(C(=C2C)C)C)C |
| Title of publication | A well-defined model system for the chromium-catalyzed selective oligomerization of ethylene. |
| Authors of publication | Monillas, Wesley H.; Young, John F.; Yap, Glenn P. A.; Theopold, Klaus H. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 25 |
| Pages of publication | 9198 - 9210 |
| a | 8.924 ± 0.003 Å |
| b | 11.555 ± 0.004 Å |
| c | 19.287 ± 0.007 Å |
| α | 106.796 ± 0.006° |
| β | 96.988 ± 0.006° |
| γ | 100.378 ± 0.007° |
| Cell volume | 1840.7 ± 1.1 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0683 |
| Residual factor for significantly intense reflections | 0.0547 |
| Weighted residual factors for significantly intense reflections | 0.1418 |
| Weighted residual factors for all reflections included in the refinement | 0.1548 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7022582.html
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