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Information card for entry 7022583
Preview
| Coordinates | 7022583.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C59 H75 Cr N2 O |
|---|---|
| Calculated formula | C49 H63 Cr N2 O |
| SMILES | [Cr]12([N](c3c(cccc3C(C)C)C(C)C)=C(C)C=C(N1c1c(cccc1C(C)C)C(C)C)C)([O]1CCCC1)CCC(=C2c1ccccc1)c1ccccc1 |
| Title of publication | A well-defined model system for the chromium-catalyzed selective oligomerization of ethylene. |
| Authors of publication | Monillas, Wesley H.; Young, John F.; Yap, Glenn P. A.; Theopold, Klaus H. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 25 |
| Pages of publication | 9198 - 9210 |
| a | 13.834 ± 0.004 Å |
| b | 17.44 ± 0.005 Å |
| c | 20.034 ± 0.005 Å |
| α | 90° |
| β | 104.087 ± 0.005° |
| γ | 90° |
| Cell volume | 4688 ± 2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0774 |
| Residual factor for significantly intense reflections | 0.0609 |
| Weighted residual factors for significantly intense reflections | 0.1682 |
| Weighted residual factors for all reflections included in the refinement | 0.1813 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7022583.html
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