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Information card for entry 7025949
Preview
| Coordinates | 7025949.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H45 Al K2 N2 O Si2 |
|---|---|
| Calculated formula | C27 H45 Al K2 N2 O Si2 |
| SMILES | [Al]1([N]([Si](C)(C)C)=C(C=C(N1[Si](C)(C)C)c1ccccc1)c1ccccc1)(C)C.[K+].[K+].O(CC)CC |
| Title of publication | Crystalline di- or trianionic metal (Al, Sm) beta-diketiminates. |
| Authors of publication | Coles, Martyn P.; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2010 |
| Journal volume | 39 |
| Journal issue | 28 |
| Pages of publication | 6426 - 6433 |
| a | 13.8525 ± 0.0007 Å |
| b | 14.1721 ± 0.0008 Å |
| c | 16.9078 ± 0.0007 Å |
| α | 90° |
| β | 101.807 ± 0.003° |
| γ | 90° |
| Cell volume | 3249.1 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.081 |
| Residual factor for significantly intense reflections | 0.0506 |
| Weighted residual factors for significantly intense reflections | 0.1003 |
| Weighted residual factors for all reflections included in the refinement | 0.1123 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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