Information card for entry 7025950

Structure parameters

• Common name: ((KSm(Me3SiCPhCHCPhNSiMe3)2)2)
• Formula: C42 H58 K N4 Si4 Sm
• Calculated formula: C42 H58 K N4 Si4 Sm
• SMILES: [Sm]12345([N]([Si](C)(C)C)=[C]3([CH]4=[C]5(N1[Si](C)(C)C)c1ccccc1)c1ccccc1)N([Si](C)(C)C)C(=CC(=[N]2[Si](C)(C)C)c1ccccc1)c1ccccc1.[K+]
• Title of publication: Crystalline di- or trianionic metal (Al, Sm) beta-diketiminates.
• Authors of publication: Coles, Martyn P.; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2010
• Journal volume: 39
• Journal issue: 28
• Pages of publication: 6426 - 6433
• a: 13.0232 ± 0.0005 Å
• b: 20.0158 ± 0.0005 Å
• c: 17.9052 ± 0.0007 Å
• α: 90°
• β: 94.925 ± 0.002°
• γ: 90°
• Cell volume: 4650.1 ± 0.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0639
• Residual factor for significantly intense reflections: 0.0394
• Weighted residual factors for significantly intense reflections: 0.0802
• Weighted residual factors for all reflections included in the refinement: 0.089
• Goodness-of-fit parameter for all reflections included in the refinement: 1.025
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No