Information card for entry 7033797

Structure parameters

• Formula: C32 H74 Cu2 N4 Si8
• Calculated formula: C32 H74 Cu2 N4 Si8
• SMILES: [Cu]1([Cu]([Si]1([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)([n]1ccc(N(C)C)cc1)[n]1ccc(N(C)C)cc1
• Title of publication: Synthesis, structural characterization and thermal properties of copper and silver silyl complexes.
• Authors of publication: Sgro, Michael J.; Piers, Warren E.; Romero, Patricio E.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 8
• Pages of publication: 3817 - 3828
• a: 18.399 ± 0.0007 Å
• b: 19.495 ± 0.0008 Å
• c: 27.347 ± 0.001 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 9809.1 ± 0.7 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 61
• Hermann-Mauguin space group symbol: P b c a
• Hall space group symbol: -P 2ac 2ab
• Residual factor for all reflections: 0.0868
• Residual factor for significantly intense reflections: 0.0592
• Weighted residual factors for significantly intense reflections: 0.094
• Weighted residual factors for all reflections included in the refinement: 0.1034
• Goodness-of-fit parameter for all reflections included in the refinement: 1.188
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No