Information card for entry 7033798

Structure parameters

• Formula: C26 H66 Cu2 N4 Si8
• Calculated formula: C26 H66 Cu2 N4 Si8
• SMILES: [Cu]1([Cu]([Si]1([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)([n]1cn(cc1)C)[n]1cn(cc1)C
• Title of publication: Synthesis, structural characterization and thermal properties of copper and silver silyl complexes.
• Authors of publication: Sgro, Michael J.; Piers, Warren E.; Romero, Patricio E.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 8
• Pages of publication: 3817 - 3828
• a: 19.9568 ± 0.0013 Å
• b: 12.5634 ± 0.0008 Å
• c: 18.0525 ± 0.0012 Å
• α: 90°
• β: 97.617 ± 0.003°
• γ: 90°
• Cell volume: 4486.3 ± 0.5 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0354
• Residual factor for significantly intense reflections: 0.0321
• Weighted residual factors for significantly intense reflections: 0.0878
• Weighted residual factors for all reflections included in the refinement: 0.0911
• Goodness-of-fit parameter for all reflections included in the refinement: 1.03
• Diffraction radiation wavelength: 1.54178 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No