Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7034736
Preview
| Coordinates | 7034736.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H26 Cl3 N O2 Si2 Ti |
|---|---|
| Calculated formula | C18 H26 Cl3 N O2 Si2 Ti |
| SMILES | [Ti](Cl)(Cl)(Cl)N([Si](c1c(OC)cccc1)(C)C)[Si](C)(C)c1c(OC)cccc1 |
| Title of publication | Group 4 metal compounds incorporating the amide ligand, [N(SiMe2{C6H4-2-OMe})2](.). |
| Authors of publication | Evans, Lloyd T. J.; Farnaby, Joy H.; Coles, Martyn P.; Cloke, F Geoffrey N; Hitchcock, Peter B. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 19 |
| Pages of publication | 8950 - 8958 |
| a | 15.3083 ± 0.0005 Å |
| b | 17.2815 ± 0.0005 Å |
| c | 18.4035 ± 0.0005 Å |
| α | 90° |
| β | 101.819 ± 0.002° |
| γ | 90° |
| Cell volume | 4765.4 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0891 |
| Residual factor for significantly intense reflections | 0.0542 |
| Weighted residual factors for significantly intense reflections | 0.1223 |
| Weighted residual factors for all reflections included in the refinement | 0.1407 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7034736.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.