Information card for entry 7034737

Structure parameters

• Formula: C20 H32 Cl2 N2 O2 Si2 Zr
• Calculated formula: C20 H32 Cl2 N2 O2 Si2 Zr
• SMILES: [Zr]12(Cl)(Cl)([O](C)c3ccccc3[Si](N2[Si](C)(C)c2ccccc2[O]1C)(C)C)N(C)C
• Title of publication: Group 4 metal compounds incorporating the amide ligand, [N(SiMe2{C6H4-2-OMe})2](.).
• Authors of publication: Evans, Lloyd T. J.; Farnaby, Joy H.; Coles, Martyn P.; Cloke, F Geoffrey N; Hitchcock, Peter B.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 19
• Pages of publication: 8950 - 8958
• a: 9.1335 ± 0.0003 Å
• b: 9.197 ± 0.0004 Å
• c: 16.6399 ± 0.0008 Å
• α: 97.298 ± 0.002°
• β: 93.494 ± 0.003°
• γ: 113.499 ± 0.002°
• Cell volume: 1261.86 ± 0.09 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0326
• Residual factor for significantly intense reflections: 0.0268
• Weighted residual factors for significantly intense reflections: 0.0633
• Weighted residual factors for all reflections included in the refinement: 0.066
• Goodness-of-fit parameter for all reflections included in the refinement: 1.132
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No