Information card for entry 7035215

Structure parameters

• Chemical name: PhGe10
• Formula: C140 H100 Ge10
• Calculated formula: C140 H100 Ge10
• SMILES: C1#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge](C#C[Ge]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Stepwise synthesis and characterization of germa[4], [5], [8], and [10]pericyclynes.
• Authors of publication: Tanimoto, Hiroki; Nagao, Tomohiko; Fujiwara, Taro; Nishiyama, Yasuhiro; Morimoto, Tsumoru; Suzuka, Toshimasa; Tsutsumi, Ken; Kakiuchi, Kiyomi
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 26
• Pages of publication: 11811 - 11818
• a: 20.2535 ± 0.0004 Å
• b: 8.91367 ± 0.00016 Å
• c: 34.6372 ± 0.0006 Å
• α: 90°
• β: 105.409 ± 0.0007°
• γ: 90°
• Cell volume: 6028.37 ± 0.19 ų
• Cell temperature: 123 ± 2 K
• Ambient diffraction temperature: 123 ± 2 K
• Number of distinct elements: 3
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0377
• Residual factor for significantly intense reflections: 0.0287
• Weighted residual factors for significantly intense reflections: 0.0619
• Weighted residual factors for all reflections included in the refinement: 0.0645
• Goodness-of-fit parameter for all reflections included in the refinement: 1.058
• Diffraction radiation wavelength: 0.71075 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No