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Information card for entry 7063230
Preview
| Coordinates | 7063230.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H34 Cu2 N10 O2 |
|---|---|
| Calculated formula | C32 H34 Cu2 N10 O2 |
| SMILES | [Cu]123(Oc4c(C=[N]2CC[NH]1Cc1ccccc1)cccc4)[N](=N#N)[Cu]12([N](CC[NH]2Cc2ccccc2)=Cc2c(O1)cccc2)[N]3=N#N |
| Title of publication | Investigation of the inherent characteristics of copper(ii) Schiff base complexes as antimicrobial agents |
| Authors of publication | Mohammed, Thasnim P.; Thennarasu, Abinaya Sushana; Jothi, Ravi; Gowrishankar, Shanmugaraj; Velusamy, Marappan; Patra, Suman; Sankaralingam, Muniyandi |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2024 |
| Journal volume | 48 |
| Journal issue | 29 |
| Pages of publication | 12877 - 12892 |
| a | 9.489 ± 0.002 Å |
| b | 9.759 ± 0.003 Å |
| c | 10.043 ± 0.003 Å |
| α | 63.432 ± 0.009° |
| β | 89.48 ± 0.009° |
| γ | 71.598 ± 0.009° |
| Cell volume | 779.7 ± 0.4 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0563 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.0861 |
| Weighted residual factors for all reflections included in the refinement | 0.0937 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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