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Information card for entry 7063231
Preview
| Coordinates | 7063231.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C17 H19 Cu N5 O |
|---|---|
| Calculated formula | C17 H19 Cu N5 O |
| SMILES | [Cu]12([N](=Cc3c(O1)ccc(c3)C)CC[NH]2Cc1ccccc1)N=N#N |
| Title of publication | Investigation of the inherent characteristics of copper(ii) Schiff base complexes as antimicrobial agents |
| Authors of publication | Mohammed, Thasnim P.; Thennarasu, Abinaya Sushana; Jothi, Ravi; Gowrishankar, Shanmugaraj; Velusamy, Marappan; Patra, Suman; Sankaralingam, Muniyandi |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2024 |
| Journal volume | 48 |
| Journal issue | 29 |
| Pages of publication | 12877 - 12892 |
| a | 13.7472 ± 0.0019 Å |
| b | 28.684 ± 0.004 Å |
| c | 8.5539 ± 0.0013 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3373 ± 0.8 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 56 |
| Hermann-Mauguin space group symbol | P c c n |
| Hall space group symbol | -P 2ab 2ac |
| Residual factor for all reflections | 0.1464 |
| Residual factor for significantly intense reflections | 0.068 |
| Weighted residual factors for significantly intense reflections | 0.1385 |
| Weighted residual factors for all reflections included in the refinement | 0.1638 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7063231.html
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Users of the data should acknowledge the original authors of the
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