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Information card for entry 7064255
Preview
| Coordinates | 7064255.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H22 Fe N4 O2 |
|---|---|
| Calculated formula | C24 H22 Fe N4 O2 |
| Title of publication | Ferrocene-containing Schiff bases and their Sn(iv) complexes with two non-conjugated redox-active fragments: dependence of spectroscopic and redox properties on complexation and solvent |
| Authors of publication | Proshutinskaya, Varvara Yu.; Krylova, Irina V.; Shangin, Pavel G.; Vilman, Victoriya A.; Minyaev, Mikhail E.; Gorbunov, Dmitry E.; Gritsan, Nina P.; Nikolaevskaya, Elena N.; Egorov, Mikhail P.; Tretyakov, Evgeny V.; Syroeshkin, Mikhail A. |
| Journal of publication | New Journal of Chemistry |
| Year of publication | 2026 |
| Journal volume | 50 |
| Journal issue | 9 |
| Pages of publication | 3906 - 3925 |
| a | 16.88798 ± 0.00012 Å |
| b | 11.87134 ± 0.00007 Å |
| c | 20.5286 ± 0.00014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4115.63 ± 0.05 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0332 |
| Residual factor for significantly intense reflections | 0.0307 |
| Weighted residual factors for significantly intense reflections | 0.0877 |
| Weighted residual factors for all reflections included in the refinement | 0.0896 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.093 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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