Information card for entry 7064256

Structure parameters

• Formula: C52 H72 Fe2 N8 O8 Sn2
• Calculated formula: C52 H72 Fe2 N8 O8 Sn2
• Title of publication: Ferrocene-containing Schiff bases and their Sn(iv) complexes with two non-conjugated redox-active fragments: dependence of spectroscopic and redox properties on complexation and solvent
• Authors of publication: Proshutinskaya, Varvara Yu.; Krylova, Irina V.; Shangin, Pavel G.; Vilman, Victoriya A.; Minyaev, Mikhail E.; Gorbunov, Dmitry E.; Gritsan, Nina P.; Nikolaevskaya, Elena N.; Egorov, Mikhail P.; Tretyakov, Evgeny V.; Syroeshkin, Mikhail A.
• Journal of publication: New Journal of Chemistry
• Year of publication: 2026
• Journal volume: 50
• Journal issue: 9
• Pages of publication: 3906 - 3925
• a: 7.63447 ± 0.00012 Å
• b: 10.59566 ± 0.00018 Å
• c: 17.044 ± 0.0003 Å
• α: 97.9351 ± 0.0014°
• β: 90.0735 ± 0.0013°
• γ: 104.065 ± 0.0014°
• Cell volume: 1323.72 ± 0.04 ų
• Cell temperature: 100 ± 0.1 K
• Ambient diffraction temperature: 100 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0475
• Residual factor for significantly intense reflections: 0.047
• Weighted residual factors for significantly intense reflections: 0.1328
• Weighted residual factors for all reflections included in the refinement: 0.1331
• Goodness-of-fit parameter for all reflections included in the refinement: 1.067
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No