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Information card for entry 7104180
Preview
| Coordinates | 7104180.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H52 N Se U |
|---|---|
| Calculated formula | C38 H52 N Se U |
| SMILES | [U]12345678([Se]c9ccccc9)(=Nc9c(cccc9C(C)C)C(C)C)([c]9([c]1([c]2([c]3([c]49C)C)C)C)C)[c]1([c]5([c]6([c]7([c]81C)C)C)C)C |
| Title of publication | Selenate and tellurate complexes of pentavalent uranium. |
| Authors of publication | Graves, Christopher R; Scott, Brian L; Morris, David E; Kiplinger, Jaqueline L |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2009 |
| Journal volume | 34 |
| Journal issue | 7 |
| Pages of publication | 776 - 778 |
| a | 12.0348 ± 0.001 Å |
| b | 18.1721 ± 0.0016 Å |
| c | 15.686 ± 0.0014 Å |
| α | 90° |
| β | 99.115 ± 0.001° |
| γ | 90° |
| Cell volume | 3387.2 ± 0.5 Å3 |
| Cell temperature | 120 ± 1 K |
| Ambient diffraction temperature | 120 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.059 |
| Residual factor for significantly intense reflections | 0.0347 |
| Weighted residual factors for significantly intense reflections | 0.0633 |
| Weighted residual factors for all reflections included in the refinement | 0.0705 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.99 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7104180.html
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Users of the data should acknowledge the original authors of the
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