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Information card for entry 7104181
Preview
| Coordinates | 7104181.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H52 N Te U |
|---|---|
| Calculated formula | C38 H52 N Te U |
| SMILES | [U]12345678([Te]c9ccccc9)(=Nc9c(cccc9C(C)C)C(C)C)([c]9([c]4([c]3([c]2([c]19C)C)C)C)C)[c]1([c]5([c]6([c]7([c]81C)C)C)C)C |
| Title of publication | Selenate and tellurate complexes of pentavalent uranium. |
| Authors of publication | Graves, Christopher R; Scott, Brian L; Morris, David E; Kiplinger, Jaqueline L |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2009 |
| Journal volume | 34 |
| Journal issue | 7 |
| Pages of publication | 776 - 778 |
| a | 10.078 ± 0.002 Å |
| b | 10.161 ± 0.002 Å |
| c | 18.643 ± 0.004 Å |
| α | 76.745 ± 0.002° |
| β | 78.811 ± 0.002° |
| γ | 70.303 ± 0.002° |
| Cell volume | 1735.1 ± 0.7 Å3 |
| Cell temperature | 120 ± 1 K |
| Ambient diffraction temperature | 120 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0652 |
| Residual factor for significantly intense reflections | 0.0469 |
| Weighted residual factors for significantly intense reflections | 0.1069 |
| Weighted residual factors for all reflections included in the refinement | 0.1147 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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