Information card for entry 7104295
| Formula |
C22 H12 O2 S3 |
| Calculated formula |
C22 H12 O2 S3 |
| SMILES |
c12c(cc(C(=O)c3ccccc3)s2)sc2c1sc(c2)C(=O)c1ccccc1 |
| Title of publication |
One-pot [1+1+1] synthesis of dithieno[2,3-b:3',2'-d]thiophene (DTT) and their functionalized derivatives for organic thin-film transistors. |
| Authors of publication |
Chen, Ming-Chou; Chiang, Yen-Ju; Kim, Choongik; Guo, Yue-Jhih; Chen, Sheng-Yu; Liang, You-Jhih; Huang, Yu-Wen; Hu, Tarng-Shiang; Lee, Gene-Hsiang; Facchetti, Antonio; Marks, Tobin J |
| Journal of publication |
Chemical communications (Cambridge, England) |
| Year of publication |
2009 |
| Journal volume |
34 |
| Journal issue |
14 |
| Pages of publication |
1846 - 1848 |
| a |
11.6446 ± 0.0005 Å |
| b |
38.297 ± 0.0017 Å |
| c |
3.8808 ± 0.0002 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1730.66 ± 0.14 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
62 |
| Hermann-Mauguin space group symbol |
P n m a |
| Hall space group symbol |
-P 2ac 2n |
| Residual factor for all reflections |
0.0817 |
| Residual factor for significantly intense reflections |
0.046 |
| Weighted residual factors for significantly intense reflections |
0.1052 |
| Weighted residual factors for all reflections included in the refinement |
0.1353 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.098 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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