Information card for entry 7104313
| Formula |
C28 H60 Hf N8 O4 |
| Calculated formula |
C28 H60 Hf N8 O4 |
| SMILES |
[Hf]1234([N](C(C)C)=C(N(C)CC)O2)([N](C(C)C)=C(N(C)CC)O4)(OC(=[N]1C(C)C)N(C)CC)[N](=C(N(C)CC)O3)C(C)C |
| Title of publication |
Hafnium carbamates and ureates: new class of precursors for low-temperature growth of HfO2 thin films. |
| Authors of publication |
Pothiraja, Ramasamy; Milanov, Andrian P; Barreca, Davide; Gasparotto, Alberto; Becker, Hans-Werner; Winter, Manuela; Fischer, Roland A; Devi, Anjana |
| Journal of publication |
Chemical communications (Cambridge, England) |
| Year of publication |
2009 |
| Journal volume |
34 |
| Journal issue |
15 |
| Pages of publication |
1978 - 1980 |
| a |
11.1068 ± 0.0004 Å |
| b |
19.5845 ± 0.0007 Å |
| c |
16.2298 ± 0.0006 Å |
| α |
90° |
| β |
100.163 ± 0.003° |
| γ |
90° |
| Cell volume |
3474.9 ± 0.2 Å3 |
| Cell temperature |
109 ± 2 K |
| Ambient diffraction temperature |
109 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0506 |
| Residual factor for significantly intense reflections |
0.0376 |
| Weighted residual factors for significantly intense reflections |
0.0518 |
| Weighted residual factors for all reflections included in the refinement |
0.0537 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.945 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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