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Information card for entry 7104429
Preview
| Coordinates | 7104429.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H32 Cu F6 N10 O P S4 |
|---|---|
| Calculated formula | C20 H32 Cu F6 N10 O P S4 |
| Title of publication | Self-assembly of a bis(adeninyl)-Cu(I) complex: a cationic nucleobase duplex mimic. |
| Authors of publication | Galindo, Miguel A; Amantia, David; Clegg, William; Harrington, Ross W; Eyre, Richard J; Goss, Jonathon P; Briddon, Patrick R; McFarlane, William; Houlton, Andrew |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2009 |
| Journal volume | 34 |
| Journal issue | 20 |
| Pages of publication | 2833 - 2835 |
| a | 8.159 ± 0.007 Å |
| b | 9.943 ± 0.011 Å |
| c | 19.52 ± 0.016 Å |
| α | 83.6 ± 0.1° |
| β | 84.1 ± 0.07° |
| γ | 84.62 ± 0.07° |
| Cell volume | 1560 ± 3 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0818 |
| Residual factor for significantly intense reflections | 0.0533 |
| Weighted residual factors for significantly intense reflections | 0.1295 |
| Weighted residual factors for all reflections included in the refinement | 0.141 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.94 |
| Diffraction radiation wavelength | 0.6894 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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