Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7105221
Preview
| Coordinates | 7105221.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H19 N O3 Ru Si2 |
|---|---|
| Calculated formula | C14 H19 N O3 Ru Si2 |
| SMILES | [Ru]12([Si](C)(C)Cc3[n]2c(ccc3)C[Si]1(C)C)(C#[O])(C#[O])C#[O] |
| Title of publication | Thermal reaction of a ruthenium bis(silyl) complex having a lutidine-based Si,N,Si ligand: formation of a mu-silyl(mu-silylene) diruthenium complex involving a 3c-2e Ru-Si-C interaction. |
| Authors of publication | Komuro, Takashi; Tobita, Hiromi |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2010 |
| Journal volume | 46 |
| Journal issue | 7 |
| Pages of publication | 1136 - 1137 |
| a | 7.1593 ± 0.0004 Å |
| b | 20.5715 ± 0.0015 Å |
| c | 12.3613 ± 0.0013 Å |
| α | 90° |
| β | 104.361 ± 0.005° |
| γ | 90° |
| Cell volume | 1763.7 ± 0.2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0434 |
| Residual factor for significantly intense reflections | 0.0333 |
| Weighted residual factors for significantly intense reflections | 0.0686 |
| Weighted residual factors for all reflections included in the refinement | 0.0749 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.15 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7105221.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.