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Information card for entry 7114111
Preview
| Coordinates | 7114111.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C68 H88 Cu4 F24 N12 O4 P4 |
|---|---|
| Calculated formula | C68 H88 Cu4 F24 N12 O4 P4 |
| Title of publication | Compartmental Schiff-base ligands as selective double-loaded extractants for copper(ii)Electronic supplementary information (ESI) available: synthetic and spectroscopic data. See http://www.rsc.org/suppdata/cc/b1/b109635b/ |
| Authors of publication | Black, Daniel; Blake, Alexander J.; Finn, Rachel L.; Lindoy, Leonard F.; Nezhadali, Azizollah; Rougnaghi, Gholamhossein; Tasker, Peter A.; Schröder, Martin |
| Journal of publication | Chemical Communications |
| Year of publication | 2002 |
| Journal issue | 4 |
| Pages of publication | 340 |
| a | 18.828 ± 0.006 Å |
| b | 18.828 ± 0.006 Å |
| c | 11.477 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4069 ± 2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 137 |
| Hermann-Mauguin space group symbol | P 42/n m c :2 |
| Hall space group symbol | -P 4ac 2a |
| Residual factor for all reflections | 0.219 |
| Residual factor for significantly intense reflections | 0.102 |
| Weighted residual factors for all reflections | 0.281 |
| Weighted residual factors for significantly intense reflections | 0.216 |
| Goodness-of-fit parameter for all reflections | 1.03 |
| Goodness-of-fit parameter for significantly intense reflections | 1.21 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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