Information card for entry 7114112

Structure parameters

• Formula: C32 H45 F12 N5 O2 P2
• Calculated formula: C32 H45 F12 N5 O2 P2
• Title of publication: Compartmental Schiff-base ligands as selective double-loaded extractants for copper(ii)Electronic supplementary information (ESI) available: synthetic and spectroscopic data. See http://www.rsc.org/suppdata/cc/b1/b109635b/
• Authors of publication: Black, Daniel; Blake, Alexander J.; Finn, Rachel L.; Lindoy, Leonard F.; Nezhadali, Azizollah; Rougnaghi, Gholamhossein; Tasker, Peter A.; Schröder, Martin
• Journal of publication: Chemical Communications
• Year of publication: 2002
• Journal issue: 4
• Pages of publication: 340
• a: 9.576 ± 0.003 Å
• b: 10.916 ± 0.003 Å
• c: 18.415 ± 0.004 Å
• α: 89.67 ± 0.03°
• β: 86.13 ± 0.03°
• γ: 78.81 ± 0.02°
• Cell volume: 1884 ± 0.9 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.122
• Residual factor for significantly intense reflections: 0.0861
• Weighted residual factors for all reflections: 0.249
• Weighted residual factors for significantly intense reflections: 0.206
• Goodness-of-fit parameter for all reflections: 1.023
• Goodness-of-fit parameter for significantly intense reflections: 1.053
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No