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Information card for entry 7114236
Preview
| Coordinates | 7114236.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H18 Br2 S3 Si2 |
|---|---|
| Calculated formula | C14 H18 Br2 S3 Si2 |
| SMILES | Brc1sc2c(sc3c([Si](C)(C)C)c(Br)sc23)c1[Si](C)(C)C |
| Title of publication | Improved synthesis of dithieno[3,2-b:2???,3???-d]thiophene (DTT) and derivatives for cross couplingElectronic supplementary information (ESI) available: spectral data for 2, 3, 6, 8, 9 and 12, experimental data for 6, displacement ellipsoid diagram for 9 and crystal packing diagram for 12. See http://www.rsc.org/suppdata/cc/b2/b207403f/ |
| Authors of publication | Frey, Joseph; Bond, Andrew D.; Holmes, Andrew B. |
| Journal of publication | Chemical Communications |
| Year of publication | 2002 |
| Journal issue | 20 |
| Pages of publication | 2424 |
| a | 12.998 ± 0.001 Å |
| b | 13.0198 ± 0.0009 Å |
| c | 13.4649 ± 0.001 Å |
| α | 75.266 ± 0.004° |
| β | 69.243 ± 0.004° |
| γ | 74.417 ± 0.004° |
| Cell volume | 2020.2 ± 0.3 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1118 |
| Residual factor for significantly intense reflections | 0.0566 |
| Weighted residual factors for significantly intense reflections | 0.1269 |
| Weighted residual factors for all reflections included in the refinement | 0.1572 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7114236.html
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