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Information card for entry 7114237
Preview
| Coordinates | 7114237.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H32 S5 |
|---|---|
| Calculated formula | C28 H32 S5 |
| SMILES | s1ccc(c1c1sc2c(sc3c2sc(c3)c2sccc2CCCCCC)c1)CCCCCC |
| Title of publication | Improved synthesis of dithieno[3,2-b:2???,3???-d]thiophene (DTT) and derivatives for cross couplingElectronic supplementary information (ESI) available: spectral data for 2, 3, 6, 8, 9 and 12, experimental data for 6, displacement ellipsoid diagram for 9 and crystal packing diagram for 12. See http://www.rsc.org/suppdata/cc/b2/b207403f/ |
| Authors of publication | Frey, Joseph; Bond, Andrew D.; Holmes, Andrew B. |
| Journal of publication | Chemical Communications |
| Year of publication | 2002 |
| Journal issue | 20 |
| Pages of publication | 2424 |
| a | 7.8796 ± 0.0004 Å |
| b | 11.3296 ± 0.0005 Å |
| c | 15.8922 ± 0.0008 Å |
| α | 76.087 ± 0.003° |
| β | 83.466 ± 0.003° |
| γ | 71.136 ± 0.003° |
| Cell volume | 1302.15 ± 0.11 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.067 |
| Residual factor for significantly intense reflections | 0.0482 |
| Weighted residual factors for significantly intense reflections | 0.1096 |
| Weighted residual factors for all reflections included in the refinement | 0.1192 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7114237.html
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