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Information card for entry 7131243
Preview
| Coordinates | 7131243.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H35 B N8 S Zn |
|---|---|
| Calculated formula | C38 H35 B N8 S Zn |
| SMILES | [Zn]12(Sc3nc4c(n3C)cccc4)[n]3n(c(C)cc3c3ccccc3)[BH](n3[n]1c(cc3C)c1ccccc1)n1[n]2c(cc1C)c1ccccc1 |
| Title of publication | Masking thiol reactivity with thioamide, thiourea, and thiocarbamate-based MBPs. |
| Authors of publication | Seo, Hyeonglim; Kohlbrand, Alysia J.; Stokes, Ryjul W.; Chung, Jeewon; Cohen, Seth M. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2023 |
| Journal volume | 59 |
| Journal issue | 16 |
| Pages of publication | 2283 - 2286 |
| a | 13.2565 ± 0.001 Å |
| b | 16.8902 ± 0.0011 Å |
| c | 16.1386 ± 0.0013 Å |
| α | 90° |
| β | 107.479 ± 0.002° |
| γ | 90° |
| Cell volume | 3446.7 ± 0.4 Å3 |
| Cell temperature | 273.15 K |
| Ambient diffraction temperature | 273.15 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0496 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.0918 |
| Weighted residual factors for all reflections included in the refinement | 0.1006 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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