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Information card for entry 7204933
Preview
| Coordinates | 7204933.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H20 S4 Sn |
|---|---|
| Calculated formula | C24 H20 S4 Sn |
| SMILES | c1(ccccc1)S[Sn](Sc1ccccc1)(Sc1ccccc1)Sc1ccccc1 |
| Title of publication | Deposition of tin sulfide thin films from tin(iv) thiolate precursors |
| Authors of publication | Barone, Giampaolo; Hibbert, Tom G.; Mahon, Mary F.; Molloy, Kieran C.; Price, Louise S.; Parkin, Ivan P.; Hardy, Amanda M. E.; Field, Mark N. |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 2 |
| Pages of publication | 464 |
| a | 17.192 ± 0.001 Å |
| b | 8.553 ± 0.002 Å |
| c | 8.342 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1226.6 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 32 |
| Hermann-Mauguin space group symbol | P b a 2 |
| Hall space group symbol | P 2 -2ab |
| Residual factor for all reflections | 0.0872 |
| Residual factor for significantly intense reflections | 0.0527 |
| Weighted residual factors for all reflections | 0.1494 |
| Weighted residual factors for significantly intense reflections | 0.1179 |
| Goodness-of-fit parameter for all reflections | 1.073 |
| Goodness-of-fit parameter for significantly intense reflections | 1.244 |
| Diffraction radiation wavelength | 0.7093 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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