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Information card for entry 7700639
Preview
| Coordinates | 7700639.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 1 |
|---|---|
| Formula | C4 H16 Br5 N2 O Pb S2 |
| Calculated formula | C4 H16 Br5 N2 O Pb S2 |
| Title of publication | Tracking the dimensional conversion process of semiconducting lead bromide perovskites by mass spectroscopy, powder X-ray diffraction, microcalorimetry and crystallography. |
| Authors of publication | Hu, Yue-Qiao; Hui, Hong-Yan; Wen, Hong-Qiang; Wang, Yanyan; Lin, Wei-Quan; Yang, De-Suo; Feng, Guo-Dong |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2019 |
| Journal volume | 48 |
| Journal issue | 34 |
| Pages of publication | 12888 - 12894 |
| a | 10.0824 ± 0.0003 Å |
| b | 8.3838 ± 0.0002 Å |
| c | 10.9546 ± 0.0004 Å |
| α | 90° |
| β | 104.184 ± 0.004° |
| γ | 90° |
| Cell volume | 897.75 ± 0.05 Å3 |
| Cell temperature | 99.99 ± 0.1 K |
| Ambient diffraction temperature | 99.99 ± 0.1 K |
| Number of distinct elements | 7 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0298 |
| Residual factor for significantly intense reflections | 0.0254 |
| Weighted residual factors for significantly intense reflections | 0.0461 |
| Weighted residual factors for all reflections included in the refinement | 0.0471 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.994 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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