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Information card for entry 7700640
Preview
| Coordinates | 7700640.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 2 |
|---|---|
| Formula | C2.46 H8.62 Br2.46 N1.23 Pb0.62 S1.23 |
| Calculated formula | C2.46154 H8.61538 Br2.46154 N1.23077 Pb0.615385 S1.23077 |
| Title of publication | Tracking the dimensional conversion process of semiconducting lead bromide perovskites by mass spectroscopy, powder X-ray diffraction, microcalorimetry and crystallography. |
| Authors of publication | Hu, Yue-Qiao; Hui, Hong-Yan; Wen, Hong-Qiang; Wang, Yanyan; Lin, Wei-Quan; Yang, De-Suo; Feng, Guo-Dong |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2019 |
| Journal volume | 48 |
| Journal issue | 34 |
| Pages of publication | 12888 - 12894 |
| a | 11.3898 ± 0.0003 Å |
| b | 11.6104 ± 0.0003 Å |
| c | 22.8884 ± 0.0006 Å |
| α | 90° |
| β | 90.983 ± 0.002° |
| γ | 90° |
| Cell volume | 3026.32 ± 0.14 Å3 |
| Cell temperature | 100 ± 0.1 K |
| Ambient diffraction temperature | 100 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0261 |
| Residual factor for significantly intense reflections | 0.0209 |
| Weighted residual factors for significantly intense reflections | 0.043 |
| Weighted residual factors for all reflections included in the refinement | 0.0442 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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