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Information card for entry 7707781
Preview
| Coordinates | 7707781.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Zn salen phenyl bis[4]helicene |
|---|---|
| Formula | C48 H36 N2 O4 Zn |
| Calculated formula | C48 H36 N2 O4 Zn |
| SMILES | [Zn]123([N](c4c([N]3=Cc3c(O2)cc2c5c6ccccc6ccc5ccc2c3)cccc4)=Cc2c(O1)cc1c3c(ccc1c2)ccc1c3cccc1)[OH2].C1OCCC1 |
| Title of publication | Schiff-base [4]helicene Zn(II) complexes as chiral emitters. |
| Authors of publication | Savchuk, Mariia; Vertueux, Steven; Cauchy, Thomas; Loumaigne, Matthieu; Zinna, Francesco; Di Bari, Lorenzo; Zigon, Nicolas; Avarvari, Narcis |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 50 |
| Journal issue | 30 |
| Pages of publication | 10533 - 10539 |
| a | 8.1499 ± 0.0014 Å |
| b | 30.4057 ± 0.0015 Å |
| c | 17.238 ± 0.003 Å |
| α | 90° |
| β | 121.19 ± 0.02° |
| γ | 90° |
| Cell volume | 3654.2 ± 1.2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.17 |
| Residual factor for significantly intense reflections | 0.0933 |
| Weighted residual factors for significantly intense reflections | 0.2204 |
| Weighted residual factors for all reflections included in the refinement | 0.2875 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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