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Information card for entry 7707782
Preview
| Coordinates | 7707782.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H12 O2 |
|---|---|
| Calculated formula | C19 H12 O2 |
| SMILES | Oc1c(cc2c(c3c(cc2)ccc2c3cccc2)c1)C=O |
| Title of publication | Schiff-base [4]helicene Zn(II) complexes as chiral emitters. |
| Authors of publication | Savchuk, Mariia; Vertueux, Steven; Cauchy, Thomas; Loumaigne, Matthieu; Zinna, Francesco; Di Bari, Lorenzo; Zigon, Nicolas; Avarvari, Narcis |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 50 |
| Journal issue | 30 |
| Pages of publication | 10533 - 10539 |
| a | 16.1657 ± 0.0014 Å |
| b | 4.0638 ± 0.0004 Å |
| c | 20.4368 ± 0.0016 Å |
| α | 90° |
| β | 109.294 ± 0.009° |
| γ | 90° |
| Cell volume | 1267.2 ± 0.2 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.051 |
| Residual factor for significantly intense reflections | 0.0454 |
| Weighted residual factors for significantly intense reflections | 0.1218 |
| Weighted residual factors for all reflections included in the refinement | 0.129 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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