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Information card for entry 7707784
Preview
| Coordinates | 7707784.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Zn salen cyclohexyldiamine (R,R) [4]helicene |
|---|---|
| Formula | C44 H34 N2 O3 Zn |
| Calculated formula | C44 H34 N2 O3 Zn |
| SMILES | [Zn]123(Oc4c(C=[N]1[C@H]1[C@@H](CCCC1)[N]3=Cc1cc3c(c5c6ccccc6ccc5cc3)cc1O2)cc1c(c4)c2c(cc1)ccc1c2cccc1)[OH2] |
| Title of publication | Schiff-base [4]helicene Zn(II) complexes as chiral emitters. |
| Authors of publication | Savchuk, Mariia; Vertueux, Steven; Cauchy, Thomas; Loumaigne, Matthieu; Zinna, Francesco; Di Bari, Lorenzo; Zigon, Nicolas; Avarvari, Narcis |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 50 |
| Journal issue | 30 |
| Pages of publication | 10533 - 10539 |
| a | 19.96 ± 0.003 Å |
| b | 8.349 ± 0.002 Å |
| c | 20.342 ± 0.004 Å |
| α | 90° |
| β | 90.642 ± 0.013° |
| γ | 90° |
| Cell volume | 3389.7 ± 1.2 Å3 |
| Cell temperature | 150 ± 10 K |
| Ambient diffraction temperature | 150 ± 10 K |
| Number of distinct elements | 5 |
| Space group number | 3 |
| Hermann-Mauguin space group symbol | P 1 2 1 |
| Hall space group symbol | P 2y |
| Residual factor for all reflections | 0.2592 |
| Residual factor for significantly intense reflections | 0.0853 |
| Weighted residual factors for significantly intense reflections | 0.1557 |
| Weighted residual factors for all reflections included in the refinement | 0.2361 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.937 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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