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Information card for entry 7707783
Preview
| Coordinates | 7707783.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H15 N O2 |
|---|---|
| Calculated formula | C20 H15 N O2 |
| SMILES | Oc1cc2c3c4ccccc4ccc3ccc2cc1C#N.OC |
| Title of publication | Schiff-base [4]helicene Zn(II) complexes as chiral emitters. |
| Authors of publication | Savchuk, Mariia; Vertueux, Steven; Cauchy, Thomas; Loumaigne, Matthieu; Zinna, Francesco; Di Bari, Lorenzo; Zigon, Nicolas; Avarvari, Narcis |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 50 |
| Journal issue | 30 |
| Pages of publication | 10533 - 10539 |
| a | 10.7403 ± 0.0002 Å |
| b | 10.8425 ± 0.00016 Å |
| c | 13.7128 ± 0.0003 Å |
| α | 90° |
| β | 109.066 ± 0.002° |
| γ | 90° |
| Cell volume | 1509.28 ± 0.05 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0397 |
| Residual factor for significantly intense reflections | 0.037 |
| Weighted residual factors for significantly intense reflections | 0.0986 |
| Weighted residual factors for all reflections included in the refinement | 0.1021 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7707783.html
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Users of the data should acknowledge the original authors of the
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